Characterisation of modified sputtered (TiAI)-based intermetallic materials doped with silver and chromium

• Type: Article in International Scientific Journal
• Date: 2000

Authors

C. Coelho (Author) Other; A. S. Ramos (Author) Other; B. Trindade (Author) Other; M. T. Vieira (Author) Other; J. V. Fernandes (Author) Other; Manuel Fernando Gonçalves Vieira (Author) FEUP

Journal

Title: Key Engineering Materials

Vol. 188

Pages: 37-44

ISSN: 1013-9826

Publisher: Trans Tech Publications Ltd

Scientific classification

FOS: Engineering and technology > Materials engineering

CORDIS: Technological sciences > Engineering > Materials engineering

Other information

Abstract (EN): TiAl-M (M = Ag, Cr) thin films were synthesised by sputtering and heat-treated in order to obtain the γ-TiAl phase. The results showed that the addition of silver or chromium does not lead to a significant improvement of the mechanical properties of the γ-TiAl structure. However, structural results obtained from similar materials produced by foundry confirm that sputtering might be used as a screening technique, in order to give helpful information for the future production of better performance bulk (titanium aluminide)-based materials. © 2000 Trans Tech Publications, Switzerland.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 8