Mixed-signal BIST using correlation and reconfigurable hardware

• Type: Article in International Conference Proceedings Book
• Date: 2000

Authors

José Machado da Silva (Author) FEUP; J. S. Duarte (Author) Other; José Silva Matos (Author) FEUP

Conference proceedings International

Title: Proceedings -Design, Automation and Test in Europe, DATE

Pages: 744-744

Design, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000

Paris, 27 March 2000 through 30 March 2000

Indexing

Scopus - 4 Citations

Other information

Authenticus ID: P-009-4YR

DOI: 10.1109/date.2000.840877

Abstract (EN): Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain iDD and uOUT cross-correlation signatures, and to measure gain, phase, and total harmonic distortion. © 2000 IEEE.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 1