From Design-for-Test to Design-for-Debug-and-Test: Analysis of Requirements and Limitations for 1149.1

• Type: Article in International Conference Proceedings Book
• Date: 1999

Authors

Gustavo Costa Alves (Author) Other; José Martins Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the VLSI Test Symposium VTS'99

VLSI Test Symposium VTS¿99

Dana Point, EUA, 25 a 29 de Abril de 1999

Scientific classification

CORDIS: Technological sciences > Engineering > Electrical engineering

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

Abstract (EN): The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mounting technologies restrict the usefulness of conventional in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. This paper analyses the main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes of the standard IEEE 1149.1 test infrastructure.

Language: Portuguese

Type (Professor's evaluation): Scientific