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Debug and test of microcontroller-based applications using the boundary scan test infrastructure

Title
Debug and test of microcontroller-based applications using the boundary scan test infrastructure
Type
Article in International Conference Proceedings Book
Year
1997
Authors
Gustavo R. Alves
(Author)
Other
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José M. M. Ferreira
(Author)
FEUP
Daniel Aga
(Author)
Other
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Ovidiu Mosuc
(Author)
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Conference proceedings International
ISIE'97 - International Symposium on Industrial Electronics
Guimarães, Portugal, 07 - JULHO - 1997
Scientific classification
CORDIS: Technological sciences > Engineering > Electrical engineering
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
Other information
Abstract (EN): Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost debug tool that uses the Boundary Scan Test infrastructure to implement the basic functionality provided by an In-circuit emulator and a logic analyser is a possible solution to overcome this economical problem. To reduce costs the Boundary Scan Test infrastructure is controlled through the parallel port of a normal Personal Computer, now widely available in classrooms.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 6
License type: Click to view license CC BY-NC
Documents
File name Description Size
7.P-SIE_1997_53172 Debug and Test of Microcontroller-Based Applications Using the Boundary Scan Test Infrastructure 449.32 KB
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