A Test Methodology to Compute Typical LNA Characterization Parameters

• Type: Article in International Conference Proceedings Book
• Date: 2004

Authors

Gabriel A. Pinho (Author) FEUP; José Machado da Silva (Author) FEUP; Hélio S. Mendonça (Author) FEUP; José S. Matos (Author) FEUP

Conference proceedings International

Title: Proceedings of XIX Conference on Design of Circuits and Integrated Systems

Pages: 127-132

XIX Conference on Design of Circuits and Integrated Systems

Bordeaux, France, November 24-26, 2004

Other information

Abstract (EN): In-circuit testing methodologies are required to tackle the evaluation of embedded radiofrequency circuits. In this paper alternative methods are proposed to compute typical Low Noise Amplifier characterization parameters. The three suggested methods allow calculating gain, 1dB compression and third-order intercept points, harmonic distortion, signal-to-noise ratio and noise figure of a LNA. Simulation results are presented as a proof of concept. Preliminary experimental results are shown, and a test infrastructure is proposed to implement these methods in an RF receiver.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6