IEEE Std 1149.7: What, Why, Where?

• Type: Article in International Conference Proceedings Book
• Date: 2012-11

Authors

José Martins Ferreira (Author) FEUP; Francisco R. Fernandes (Author) Other; Ricardo J. S. Machado (Author) Other; Manuel G. O. Gericota (Author) Other

Conference proceedings International

Title: XXVII Conference on Design of Circuits and Integrated Systems (DCIS'2012)

Pages: 118-123

XXVII Conference on Design of Circuits and Integrated Systems (DCIS'2012)

Avignon, France, 28 a 30 de Novembro de 2012

Scientific classification

CORDIS: Technological sciences > Engineering > Electrical engineering

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

Abstract (EN): The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when used along with other IEEE standards (particularly those that use the IEEE Std 1149.1 for test access and control). In this paper we describe ¿what¿ is the IEEE Std 1149.7, the reasons ¿why¿ we may consider to use it instead of IEEE Std 1149.1, and we highlight the application spectrum ¿where¿ this new standard can be useful.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6