Go to:
Logótipo
Você está em: Start > Publications > View > IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
Map of Premises
Principal
Publication

IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2

Title
IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
Type
International Conference Proceedings Book
Year
2003
Conference International
20th IEEE Instrumentation and Measurement Technology Conference
VAIL, CO, MAY 20-22, 2003
Other information
Language: English
Type (Professor's evaluation): Scientific
ISBN: 0-7803-7705-2
Collection: IEEE Instrumentation and Measurement Technology Conference
Vol.: 2
Documents
We could not find any documents associated to the publication.
Publications included
Computing ADC harmonic content from a reduced number of valuesImported from Authenticus
Article in International Conference Proceedings Book
Hélio Mendonça (Author) (FEUP); José Machado da Silva (Author) (FEUP); José Silva Matos (Author) (FEUP)
2003
Indexing
Recommend this page Top
Copyright 1996-2025 © Faculdade de Medicina Dentária da Universidade do Porto  I Terms and Conditions  I Acessibility  I Index A-Z
Page created on: 2025-08-08 at 20:07:23 | Privacy Policy | Personal Data Protection Policy | Whistleblowing | Electronic Yellow Book