Characterization of nanostructured HfO2 films using Perturbed Angular Correlation (PAC) technique

• Type: Article in International Conference Proceedings Book
• Date: 2010

Authors

Cavalcante, FHM (Author) Other; Gomes, MR (Author) Other; Carbonari, AW (Author) Other; Pereira, LFD (Author) Other; Rossetto, DA (Author) Other; Costa, MS (Author) Other; Redondo, LM (Author) Other; Mestnik Filho, J (Author) Other; Saxena, RN (Author) Other; Soares, JC (Author) Other

Conference proceedings International

Title: HYPERFINE INTERACTIONS

Pages: 41-45

3rd Joint International Conference on Hyperfine Interactions (HFI) / International Symposium on Nuclear Quadrupole Interactions (NQI)

Geneva, SWITZERLAND, SEP 12-17, 2010

Indexing

ISI Web of Knowledge - 1 Citation

Scopus - 2 Citations

Other information

Authenticus ID: P-007-XC2

DOI: 10.1007/s10751-010-0250-z

Abstract (EN): The hyperfine field at Ta-181 lattice sites in nanostructured HfO2 thin films was studied by the Perturbed Angular Correlation (PAC) technique. Thin oxide films were deposited by Electron Beam Evaporation on a silicon substrate. The thickness of the films was similar to 100 nm and similar to 250 nm. Radioactive Hf-181 nuclei were produced by neutron activation of the film samples in the Brazilian Research Reactor (IPEN IEA-R1) by the reaction Hf-180(n,gamma)Hf-181. PAC measurements were carried out after annealing at 1473 K. The PAC technique allows the determination of the electric field gradient (EFG) at the probe sites.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5