Characterisation of modified sputtered (TiAl)-based intermetallic materials doped with silver and chromium

• Type: Article in International Scientific Journal
• Date: 2000

Authors

C. Coelho (Author) Other; A. S. Ramos (Author) Other; B. Trindade (Author) Other; M. T. Vieira (Author) Other; J. V. Fernandes (Author) Other; Manuel Vieira (Author) FEUP

Journal

The Journal is awaiting validation by the Administrative Services.

Title: DEVELOPMENT IN LIGHT METALS: SCIENCE, TECHNOLOGY AND APPLICATION

Vol. 188

Pages: 37-44

ISSN: 1013-9826

Indexing

ISI Web of Knowledge - 3 Citations

Scopus - 3 Citations

Scientific classification

FOS: Engineering and technology > Materials engineering

Other information

Authenticus ID: P-001-1CB

DOI: 10.4028/www.scientific.net/kem.188.37

Abstract (EN): TiAl-M (M = Ag, Cr) thin films were synthesised by sputtering and heat-treated in order to obtain the gamma -TiAl phase. The results showed that the addition of silver or chromium does not lead to a significant improvement of the mechanical properties of the gamma -TiAl structure. However, structural results obtained from similar materials produced by foundry confirm that sputtering might be used as a screening technique, in order to give helpful information for the future production of better performance bulk (titanium aluminide)-based materials.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 8