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Advanced Techniques for Materials Characterization

Code: M.EMAT005     Acronym: TACM

Keywords
Classification Keyword
OFICIAL Science and Technology of Materials

Instance: 2025/2026 - 1S Ícone do Moodle

Active? Yes
Responsible unit: Metallurgy, Materials and Technological Processes Section
Course/CS Responsible: Master in Materials Engineering

Cycles of Study/Courses

Acronym No. of Students Study Plan Curricular Years Credits UCN Credits ECTS Contact hours Total Time
M.EMAT 16 Syllabus 1 - 6 39 162

Teaching Staff - Responsibilities

Teacher Responsibility
Sónia Luísa dos Santos Simões

Teaching - Hours

Recitations: 2,00
Laboratory Practice: 1,00
Type Teacher Classes Hour
Recitations Totals 1 2,00
Sónia Luísa dos Santos Simões 2,00
Laboratory Practice Totals 2 2,00
Sónia Luísa dos Santos Simões 2,00
Mais informaçõesLast updated on 2025-09-30.

Fields changed: Program

Teaching language

English

Objectives

The objective of this curricular unit is the presentation and description of advanced concepts on the various forms of material characterization, at a morphological, structural and chemical level and mainly at the nanometer scale. Basic knowledge of each technique will include an understanding of instrumentation, sample preparation, and applicability of these techniques to provide the essential foundations for application in the characterization of the materials under study. The acquisition of this knowledge will allow the identification and distinction of the applicability of each characterization technique in order to associate, relate, and select the characterization techniques of the material under study. The group work will aim not only to gain greater competence in communication strategies but also to provide an opportunity to select, research and present a material characterization technique that can be applied to real case study situations.

Learning outcomes and competences

-Develop skills and knowledge on advanced materials characterization techniques.
-Develop skills to select the best techniques to materials characterization taking into account the needs and means at their disposal.
-Select, researches and present a technique for characterization of advanced materials that can be applied to situation of real case studies.
-Develop team work and communication skills (oral and written).

Working method

Presencial

Pre-requirements (prior knowledge) and co-requirements (common knowledge)

Students need to know the techniques used to characterize materials since this course will only cover more advanced techniques associated with processing the results obtained from these techniques.

Program





Description of various advanced material characterization techniques. The topics that are covered in this curricular unit are:

1. Introduction to Advanced Electron-Based Characterization
-Spatial resolution, contrast, aberrations, and corrections
-Sample preparation for advanced electron analysis (FIB, electropolishing, selectivedeposition)
-Practical considerations: analysis environment, stability, and experimental control


2. EBSD (Electron Backscatter Diffraction)
-Fundamentals of backscattered electron diffraction
-Mapping of crystal orientation, texture, grain size, and grain boundaries
-Applications in metallic, ceramic, and polycrystalline materials
-Analysis of local strains and deformations


3. Transmission Kikuchi Diffraction / t-EBSD
-Principles and advantages compared to conventional EBSD
-Application in thin films, interfaces, and small particles
-Improved angular and spatial resolution
-Applications in mapping highly deformed regions and nanomaterials


4. HRTEM (High-Resolution Transmission Electron Microscopy)
-Image formation in HRTEM: phase contrast and sub-Ångström resolution
-Analysis of defects, interfaces, atomic planes, and crystal stacking
-Simulation and interpretation of HRTEM images
-Instrumental and environmental requirements


5. ACTEM (Aberration-Corrected Transmission Electron Microscopy)
-Aberration correctors: types, principles, and impact on resolution
-Advantages for atomic-scale structural and chemical analysis
-Applications in frontier research: point defects, doping, complex structures


6. Precision TEM / Quantitative TEM
-Quantitative measurement of displacements and strain fields from high-resolution images
-Integration with simulation methods (multislice, GPA, etc.)
-Quantitative analysis of defects and lattice distortions


7. 4D-STEM (Four-Dimensional Scanning Transmission Electron Microscopy)
-Principles: acquisition of diffraction patterns at each scan point
-Associated techniques: ptychography, electric field and strain mapping
-Data reconstruction and analysis using advanced computational tools
-Emerging applications in functional materials and complex interfaces


8. ETEM (Environmental TEM)
-Characterization of materials under reactive conditions (gas, temperature, electric/magnetic field)
-In situ observation of chemical reactions, phase growth, sintering, etc.
-Limitations, technical challenges, and experimental safety
-Case studies in catalysis, corrosion, energy materials, and biomaterials


9. Integration and Interdisciplinary Applications
-Comparison and selection of techniques according to scientific or technological questions
-Case studies in advanced materials: semiconductors, nanomaterials, batteries, 2D materials
-Integration of EBSD, TEM, XPS, and spectroscopic techniques for comprehensive characterization
-Development of skills for multidimensional data interpretation





Mandatory literature

A. K. Tyagi, Mainak Roy, S. K. Kulshreshtha and S. Banerjee; Advanced Techniques for Materials Characterization, Trans Tec Publications Inc., 2009
Bruno, Thomas J.,; ASM Handbook.. ISBN: 978-1-62708-213-6

Complementary Bibliography

David B. Williams; Transmission electron microscopy. ISBN: 978-0-387-76500-6
Ziegler, Alexander.; In-situ Materials Characterization : Across Spatial and Temporal Scales /. ISBN: 3-642-45151-9

Teaching methods and learning activities

The working group will have to make a presentation to the public in the classroom where they should focus on the following points: research motivation, description of characterization techniques, selection of characterization technique according to the purpose of the study, interpretation of results and treatment of the results obtained and for each technical characterization addressed.

The practical sessions aim to relate and establish the knowledge acquired in the theoretical sessions with the observation of characterization techniques in real use.

Software

DigitalMicrograph
Atex

Evaluation Type

Distributed evaluation with final exam

Assessment Components

Designation Weight (%)
Participação presencial 30,00
Exame 40,00
Trabalho laboratorial 30,00
Total: 100,00

Amount of time allocated to each course unit

Designation Time (hours)
Apresentação/discussão de um trabalho científico 25,00
Estudo autónomo 65,00
Frequência das aulas 25,00
Trabalho escrito 25,00
Trabalho laboratorial 12,00
Trabalho de investigação 10,00
Total: 162,00

Eligibility for exams

In order for students to attend the course, they must complete the assignments throughout the semester.
Attend laboratory classes.

Calculation formula of final grade

Evaluation formula: Final grade = 30% written assignments + 30 % pratical work + 40% exam

Special assessment (TE, DA, ...)

The evaluation will be done by exam (70%) and a monograph (30%).

Classification improvement

Students can improve their grades of the tests by attending an extra exam, which will be a 2 hour long closed book exam. Students have to enrol before the deadline.
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