Application of optimum-path forest classifier for synthetic material porosity segmentation

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2010

Autores

Victor H. C. Albuquerque (Autor) FEUP; João P. Papa (Autor) Outra; Alexandre X. Falcão (Autor) Outra; Pedro P. R. Filho (Autor) Outra; João Manuel Ribeiro da Silva Tavares (Autor) FEUP

Ata de Conferência Internacional

Título: IWSSIP'10 - 17th International Conference on Systems, Signals and Image Processing

Páginas: 57-60

IWSSIP'10 - 17th International Conference on Systems, Signals and Image Processing Rio de Janeiro, Brazil 17-19 June 2010 ISBN: 978-85-228-0565-5

Rio de Janeiro, Brazil, 17-19 June 2010

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Engenharia mecânica

CORDIS: Ciências Tecnológicas > Tecnologia > Tecnologia de computadores > Processamento de imagem

Outras Informações

Abstract (EN): This paper presents a new application and evaluation of the Optimum-Path Forest (OPF) classifier to accomplish synthetic material porosity segmentation and quantification obtained from optical microscopic images. Sample images of a synthetic material were analyzed and the quality of the results was confirmed by human visual analysis. Additionally, the OPF results were compared against two different Support Vector Machines approaches, confirming the OPF superior fast and reliable qualities for this analysis purpose. Thus, the Optimum-Path Forest classier demonstrated to be a valid and adequate tool for microstructure characterization through porosity segmentation and quantification using microscopic images, manly due its fast, efficient and reliable manner.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 4