New temperature scan method (TSM) for revealing the chiral smectic polar phases

• Type: Article in International Scientific Journal
• Date: 1996

Authors

Carvalho, PS (Author) FCUP; Glogarova, M (Author) Other; Chaves, MR (Author) FCUP; Destrade, C (Author) Other; Nguyen, HT (Author) Other

Journal

Title: Liquid Crystals

Vol. 21

Pages: 115-119

ISSN: 0267-8292

Publisher: Taylor & Francis

Indexing

ISI Web of Knowledge - 9 Citations

Scopus - 9 Citations

Scientific classification

FOS: Natural sciences > Chemical sciences

Other information

Authenticus ID: P-001-E30

DOI: 10.1080/02678299608033801

Abstract (EN): A new simple and reliable method to identify the antiferro-, ferri- and ferro-electric and the S-C alpha* phases has been worked out, involving temperature scanning of the liquid crystalline sample under a square wave electric field. The d.c. current recorded during the temperature run provides information about the phases and the phase transition temperatures. The resolution power of the method is checked by the study of three compounds. The results obtained by this new Temperature Scan Method (TSM) are compared to those found from dielectric measurements and from the study of the optical and dielectric hysteresis loops.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5