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Promoting Surface Conduction through Scalable Structure Engineering of Flexible Topological Insulator Thin Films

Title
Promoting Surface Conduction through Scalable Structure Engineering of Flexible Topological Insulator Thin Films
Type
Article in International Scientific Journal
Year
2024
Authors
Moreira, M
(Author)
Other
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Pires, AL
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Ferreira-Teixeira, S
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Iurkevich, O
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Vilarinho, R
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ISSN: 1616-301X
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Publicação em ISI Web of Knowledge ISI Web of Knowledge - 0 Citations
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Authenticus ID: P-016-XP5
Abstract (EN): Spintronics, micro/nanofabrication, and the semiconductor industry are undergoing significant transformations, highlighting the need for flexible technologie. This study examines the possibility of integrating topological insulators (TIs), specifically Bi2Te3 thin films (13-191 nm), into flexible spintronic applications through scalable magneto-sputtering techniques, and investigates how structural organization influences electrical and topological properties through post-thermal annealing. Films annealed above 250 degrees C display improved polycrystalline structure, larger crystallites, fewer local defects, and higher a room-temperature Seebeck coefficient (S) and resistivity (rho), suggesting decreased bulk electronic contributions. A metastable transport regime is identified in the temperature-dependent resistivity of films annealed at 300 degrees C between 20-100 K; in this range, the thinnest film exhibits markedly metallic behavior, signaling the presence of topological surface states (TSS). Magnetoresistance measurements of as-grown and annealed films, between 3-20 K, demonstrate weak antilocalization. Applying the Hikami-Larkin-Nagaoka model, alpha-coefficients are found to scale with thickness from 0.5-1, indicating thickness-controlled coupling of the TSS. Post-annealing at 300 degrees C, the phase coherence length, L phi, of the thinner films increases, while the temperature dephasing rate shifts from similar to 0.7 (as-grown) to similar to 0.5 (post-annealing), aligning with expected values for 2D TSS. These are encouraging findings for large-scale manufacturing flexible TI technologies, without sacrificing tunabilit. This study pioneers the integration of Bi2Te3 topological insulators into flexible substrates, through DC magneto-sputtering and thermal annealing. The flexible thin films show compelling evidence of topological conduction. Remarkably, annealing enhances magnetoresistance, aligning it perfectly with Hikami-Larkin-Nagaoka predictions for weak antilocalization, suggesting improved topological conduction through innovative structural engineering. This breakthrough paves the way for promising advances in flexible spintronics. image
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 13
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