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Ultra high-frequency data acquisition AMC module for high performance applications

Title
Ultra high-frequency data acquisition AMC module for high performance applications
Type
Article in International Scientific Journal
Year
2013
Authors
Pereira, RC
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Combo, A
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Correia, M
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Rodrigues, AP
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Fernandes, A
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Sousa, J
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Correia, CMBA
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Goncalves, B
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Varandas, CAF
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Journal
Vol. 88
Pages: 1409-1413
ISSN: 0920-3796
Publisher: Elsevier
Other information
Authenticus ID: P-008-EYN
Abstract (EN): This paper describes the design and implementation of an ultra high-frequency data acquisition advanced mezzanine card (AMC) module, suitable for use in micro advanced telecommunications computing architecture (mu ATCA) and ATCA systems. This module is designed to meet the processing needs of high-performance applications required by the fast plant system controllers. It is also designed for high-availability (HA) and is envisaged to be used by the next generation of nuclear fusion diagnostics (e.g. as microwave reflectometry, plasma position reflectometry and Thomson scattering), foreseen for future fusion devices like the International Thermonuclear Experimental Reactor (ITER) tokamak or the Wendelstein 7-X (W7X) stellarator. The developed module is a full size AMC designed to cope with the PICMG (R) AMC.0 R2.0 specifications. All the architecture is based on the ultra high-speed ADC that allows dual-channel sampling rate up to 1.0/1.6 GSPS at 10/12-bit or a single-channel up to 2.0/3.2 GSPS at 10/12-bit. The AMC module features a Field Programmable Gate Array (FPGA), Virtex (TM)-6 from Xilinx that is able to manage high-speed data paths and implement high data rate processing algorithms. This FPGA supports multiple switch fabric protocols (PCIe, SRIO, and GigE). The module features also up to 2 GB of double data rate (DDR3) memory for data storage and 128 MB DDR3 memory for general purpose application, like, for instance, a soft processor core or digital filters. Also, a module management controller (MMC), required by the AMC standard, is implemented on-board to monitor the available and required hardware system management parameters.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 5
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