MEASUREMENT OF THERMAL EFFECTS IN MONOLITHIC VOLTAGE COMPARATORS

• Type: Article in International Scientific Journal
• Date: 1992

Authors

DOMINGUES, JPP (Author) Other; SIMOES, JBPS (Author) Other; CORREIA, CMBA (Author) Other

Journal

Title: Measurement Science and Technology

Vol. 3

Pages: 1050-1053

ISSN: 0957-0233

Publisher: Institute of Physics Publishing

Indexing

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Other information

Authenticus ID: P-001-P2J

DOI: 10.1088/0957-0233/3/11/005

Abstract (EN): The monolithic voltage comparator is reviewed, focusing on behaviour in the pulsed (dynamic) mode of operation. Special attention is dedicated to the influence of short term history of the inputs on the thermal offset. A method is presented and discussed that reveals and quantifies the thermal offset, with 25 muV resolution, by measuring a hysteresis introduced on the comparator dynamic transition curve. It is shown that the deviation in comparator output due to thermal imbalance of the input differential pair, can significantly affect the response of a 16 bit ADC (2 or 3 least significant bits in a 10 V input range).

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 4