Active replication : towards a truly SRAM-based FPGA on-line concurrent testing

• Type: Article in International Conference Proceedings Book
• Date: 2002

Authors

Manuel G. Gericota (Author) Other; Gustavo R. Alves (Author) Other; Miguel L. Silva (Author) FEUP; José M. Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW'02)

Pages: 165-169

8th IEEE International On-Line Testing Workshop (IOLTW'02)

Ilha de Bendor, França, 8 a 10 de Julho de 2002

Indexing

ISI Web of Science

Scopus

INSPEC

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences > Engineering > Electrical engineering

Other information

DOI: 10.1109/OLT.2002.1030201

Abstract (EN): The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reconfigurable computing platforms, employing complex SRAM-based FPGAs. However, new semiconductor manufacturing technologies increases FPGAs probability of lifetime operation failures, requiring new on?line testing / fault-tolerance methods able to improve the dependability of the systems where they are included. The Active Replication technique present in this paper is a set of procedures that enables the implementation of a truly non-intrusive structural on-line concurrent testing approach, detecting and avoiding permanent faults and correcting errors due to transient faults. In relation to a previous technique proposed by the authors as part of the DRAFT FPGA concurrent test methodology, the Active Replication technique extends the range of circuits that can be replicated, by introducing a novel method with very low silicon overhead.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5