A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs

• Type: Article in International Conference Proceedings Book
• Date: 2002

Authors

Manuel G. Gericota (Author) Other; Gustavo R. Alves (Author) Other; Miguel L. Silva (Author) Other; José M. Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the Design, Automation and Test in Europe Conference (DATE'02)

Pages: 1126-1126

Design, Automation and Test in Europe Conference (DATE'02)

Paris, França, 4 a 8 de Março de 2002

Indexing

ISI Web of Science

Scopus

INSPEC

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences > Engineering > Electrical engineering

Other information

DOI: 10.1109/DATE.2002.998482

Abstract (EN): This poster presents the first truly non-intrusive structural concurrent test approach, with the objective of testing partially and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active Configurable Logic Blocks (CLBs), i.e. CLBs that are part of an implemented function that is actually being used by the system, releasing it to be tested in a way that is completely transparent to the system.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 1