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Test Node Selection and Fault Diagnosis in an IEEE1149.4 Environment

Title
Test Node Selection and Fault Diagnosis in an IEEE1149.4 Environment
Type
Article in International Conference Proceedings Book
Year
1999
Authors
Luís Laranjeira
(Author)
Other
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José Machado da Silva
(Author)
FEUP
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José Silva Matos
(Author)
FEUP
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Conference proceedings International
Palma de Mallorca, 23 - NOVEMBRO - 1999
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
CORDIS: Technological sciences > Engineering > Electrical engineering
Other information
Language: Portuguese
Type (Professor's evaluation): Scientific
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