Versatile Seebeck and electrical resistivity measurement setup for thin films

• Type: Article in International Scientific Journal
• Date: 2021

Authors

Ferreira Teixeira, S (Author) Other; F.C. Carpinteiro (Author) FCUP; araujo, j. p. (Author) FCUP; Sousa, JB (Author) Other; pereira, a. m. (Author) FCUP

Journal

Title: Review of Scientific Instruments

Vol. 92

ISSN: 0034-6748

Publisher: American Institute of Physics

Indexing

ISI Web of Knowledge - 6 Citations

Scopus - 7 Citations

Other information

Authenticus ID: P-00T-S3P

DOI: 10.1063/5.0036817

Abstract (EN): A custom setup for Seebeck coefficient and electrical resistivity measurements of thin films as a function of temperature in the range of 10-300 K was developed. The Seebeck coefficient is measured using a two-probe arrangement and using either a dynamical or steady/quasi-steady differential method. The temperature differences (Delta Ts) for these measurements across the samples are achieved by using resistive heaters embedded in two copper blocks. The sample is screwed to these blocks and is in pressured contact with the measurement probes. The electrical resistivity is measured with a two-probe arrangement. To verify the reliability of the developed setup, measurement tests were performed on commercial niobium foil and a specular spin valve previously studied, having obtained a great accordance (within similar to 3%) between this setup's experimental results and the reference measurements.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6