Morphological and structural characteristics presented by the Cu-Sn-Cu metallurgical system used in electronic joints

• Type: Article in International Scientific Journal
• Date: 2000

Authors

J. Ferreira (Author) Other; B. Fernandes (Author) Other; C. Gonçalves (Author) Other; P. Nunes (Author) Other; E. Fortunato (Author) Other; R. Martins (Author) Other; José Inácio Martins (Author) FEUP; A.P. Marvão (Author) Other

Journal

The Journal is awaiting validation by the Administrative Services.

Title: MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

Vol. 288 No. 2

Pages: 248-252

ISSN: 0921-5093

Indexing

ISI Web of Knowledge - 4 Citations

ISI Web of Science

Scopus - 6 Citations

Other information

Authenticus ID: P-000-YZK

DOI: 10.1016/s0921-5093(00)00859-5

Abstract (EN): Results are presented concerning the morphological and structural characteristics exhibited by the Cu-Sn-Cu system to be used in electronic lead-free soldering processes, under different process temperatures and pressures. The results show that the Cu3Sn or Cu6Sn5 phases needed to supply the thermal, mechanical and electrical stability to the joints formed require Sn layers (either electrodeposited or by using preforms) whose thickness depends on the process temperature used. For process temperatures of 533 K the thickness of the Sn layer should be above 20 mu m, while for process temperatures of 573 K, the Sn thickness required is reduced to 10 mu m. The joints formed support shear stresses above 12 MPa, as required by electronic standards. Apart from that, microcracks start appearing if an excess of Sn is used during the soldering operation. The set of tests performed indicates that this new joint is quite promising to substitute the conventional solder process applied to power diodes.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5