Error Tolerant MPC versus PI Control - a Crystallization Case Study

• Type: Article in International Conference Proceedings Book
• Date: 2009

Authors

Luis Alberto Paz Suárez (Author) FEUP; Petia Georgieva (Author) FEUP; Sebastião Feyo de Azevedo (Author) FEUP

Conference proceedings International

Title: Proceedings of the European Control Conference 2009 (ECC2009)

Pages: 2899-2904

European Control Conference 2009 (ECC2009)

Budapeste, Hungria, 23 a 26 de Agosto

Scientific classification

FOS: Engineering and technology > Chemical engineering

CORDIS: Technological sciences > Engineering > Chemical engineering

Other information

Abstract (EN): The present work is focused on a comparative study between the classical PI(D) control and an error tolerant modification of the nonlinear MPC approach implemented to a fed-batch sugar crystallization process. Two scenarios are considered: i) (nominal case) MPC versus PI assuming no disturbances or noise and ii) MPC versus PI with disturbances and noise due to original industrial data implemented in the tests. The results demonstrate that the MPC outperforms the PI control with respect to the final batch performance measures (less energy consumption, improved crystal size parameters and higher productivity). The usual high MPC computational costs are significantly reduced by the proposed error tolerant modification of the optimization procedure.

Language: English

Type (Professor's evaluation): Scientific