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In situ characterization of the p-Si/NH4F interface during dissolution in the current oscillation regime

Title
In situ characterization of the p-Si/NH4F interface during dissolution in the current oscillation regime
Type
Article in International Scientific Journal
Year
1998
Authors
S.Cattarin
(Author)
Other
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J.N.Chazalviel
(Author)
Other
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Carlos Fonseca
(Author)
FEUP
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F.Ozanam
(Author)
Other
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L.M.Peter
(Author)
Other
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G. Schlichthorl
(Author)
Other
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J.Stumper
(Author)
Other
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Journal
Indexing
Publicação em ISI Web of Science ISI Web of Science
Scientific classification
FOS: Engineering and technology > Other engineering and technologies
Other information
Language: Portuguese
Type (Professor's evaluation): Scientific
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