CONTROL AND OBSERVATION OF ANALOG NODES IN MIXED-SIGNAL BOARDS

• Type: Article in International Conference Proceedings Book
• Date: 1993

Authors

José S. Matos (Author) FEUP; Ana C. Leão (Author) FEUP; João Canas Ferreira (Author) FEUP

Conference proceedings International

Title: INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS: DESIGNING, TESTING, AND DIAGNOSTICS - JOIN THEM

Pages: 323-331

International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them

BALTIMORE, MD, OCT 17-21, 1993

Indexing

ISI Web of Knowledge - 10 Citations

Scopus - 18 Citations

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

Authenticus ID: P-001-NMZ

Abstract (EN): BST is a well established standard and testability framework for digital ICs and boards. The paper presents a test support IC controlled by an IEEE1149.1 interface, capable of providing access to analog nodes in mixed-signal boards. The proposed architecture (ABSINT - Analog to Boundary Scan Interface) is described and relevant implementation issues are discussed. A demonstrator IC implementing the ABSINT architecture is presented, and it is shown how it can be used to provide analog test channels under control of IEEE1149.1.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 9