A framework for self-healing radiation-tolerant implementations on reconfigurable FPGAs

• Type: Article in International Conference Proceedings Book
• Date: 2007

Authors

Manuel G. Gericota (Author) Other; Luís F. Lemos (Author) Other; Gustavo R. Alves (Author) Other; José M. Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 07)

Pages: 301-306

10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 07)

Cracóvia, Polónia, 11 a 13 de Abril de 2007

Indexing

ISI Proceedings

ISI Web of Science

Scopus

INSPEC

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

DOI: 10.1109/DDECS.2007.4295300

Abstract (EN): To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scales are highly vulnerable to radiation-induced faults that affect values stored in memory cells. Since the functional definition of FPGAs relies on memory cells, they become highly prone to this type of faults. Fault tolerant implementations, based on Triple Modular Redundancy (TMR) infrastructures, help to keep the correct operation of the circuit. However, TMR is not sufficient to guarantee the safe operation of a circuit. Other issues like the effects of Multi-Bit Upsets (MBU) or fault accumulation, have also to be addressed. Furthermore, in case of a fault occurrence the correct operation of the affected module must be restored and the current state of the circuit coherently re-established. A solution that enables the autonomous correct restoration of the functional definition of the affected module, avoiding fault accumulation, re-establishing the correct circuit state in realtime, while keeping the normal operation of the circuit, is presented in this paper.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6