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Band gap and band tailing behaviour of PLZT films

Title
Band gap and band tailing behaviour of PLZT films
Type
Article in International Scientific Journal
Year
2007
Authors
Khodorov, A
(Author)
Other
The person does not belong to the institution. The person does not belong to the institution. The person does not belong to the institution. View Authenticus page Without ORCID
Gomes, MJM
(Author)
Other
The person does not belong to the institution. The person does not belong to the institution. The person does not belong to the institution. View Authenticus page Without ORCID
Journal
Title: FerroelectricsImported from Authenticus Search for Journal Publications
Vol. 360
Pages: 153-158
ISSN: 0015-0193
Publisher: Taylor & Francis
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Publicação em ISI Web of Knowledge ISI Web of Knowledge - 0 Citations
Publicação em Scopus Scopus - 0 Citations
Other information
Authenticus ID: P-004-D4X
Abstract (EN): Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) substrate by sol-gel method. The cell parameters of films were calculated with help of whole pattern fitting procedure. The study of optical properties revealed the fractal behaviour of absorption coefficient near the absorption edge. The strong shift of the absorption edge in thin films in comparison with bulk PLZT was observed. This shift could not be caused just by the presence of the strain. The increased disorder and polarization fluctuations were suggested as the additional reason that was supported by nearly twice higher value of the exponential tail width in the films in comparison with bulk PLZT.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 6
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