HRTEM and GIXRD studies of CdS nanocrystals embedded in Al2O3 films produced by magnetron RF-sputtering

• Type: Article in International Scientific Journal
• Date: 2003

Authors

Conde, O (Author) Other; Rolo, AG (Author) Other; Gomes, MJM (Author) Other; Ricolleau, C (Author) Other; Barber, DJ (Author) Other

Journal

Title: Journal of Crystal Growth

Vol. 247

Pages: 371-380

ISSN: 0022-0248

Publisher: Elsevier

Indexing

ISI Web of Knowledge - 18 Citations

Scopus - 22 Citations

Other information

Authenticus ID: P-000-K00

DOI: 10.1016/s0022-0248(02)01975-9

Abstract (EN): In this paper we report on the structural properties of as-grown CdS nanoparticles embedded in Al2O3 films produced by a magnetron RF-sputtering technique. Grazing incidence X-ray diffraction together with high-resolution transmission electron microscopy (HRTEM) and electron diffraction were used to study the crystallinity and morphology of the CdS nanocrystals. Depending on the deposition parameters, elongated or spherical nanocrystals were grown. HRTEM shows evidence of the growth of CdS nanocrystals at room temperature with sizes in the range of 3-8 nm, and indicates that the nanocrystals formed in the cubic phase during the early stages of the deposition process. Stress-free films were formed under selected deposition conditions.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 10