Optical properties study of PLZT films deposited on sapphire Substrate

• Type: Article in International Scientific Journal
• Date: 2008

Authors

Khodorov, A (Author) Other; Gomes, MJM (Author) Other

Journal

Title: Vacuum

Vol. 82

Pages: 1495-1498

ISSN: 0042-207X

Publisher: Elsevier

Indexing

ISI Web of Knowledge - 4 Citations

Scopus - 7 Citations

Other information

Authenticus ID: P-003-X2R

DOI: 10.1016/j.vacuum.2008.03.006

Abstract (EN): Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) Substrate by sol-gel method. The cell parameters of films were calculated with help of whole-pattern fitting procedure. The evolution of strain, shift of absorption edge and change in the band tailing with film thickness were found and analyzed for amorphous and polycrystalline PUT films. The refractive index n was computed with help of "Envelope method" and dielectric function was calculated by fitting the measured optical transmission spectrum.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 4