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Optical properties study of PLZT films deposited on sapphire Substrate

Title
Optical properties study of PLZT films deposited on sapphire Substrate
Type
Article in International Scientific Journal
Year
2008
Authors
Khodorov, A
(Author)
Other
The person does not belong to the institution. The person does not belong to the institution. The person does not belong to the institution. View Authenticus page Without ORCID
Gomes, MJM
(Author)
Other
The person does not belong to the institution. The person does not belong to the institution. The person does not belong to the institution. View Authenticus page Without ORCID
Journal
Title: VacuumImported from Authenticus Search for Journal Publications
Vol. 82
Pages: 1495-1498
ISSN: 0042-207X
Publisher: Elsevier
Other information
Authenticus ID: P-003-X2R
Abstract (EN): Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) Substrate by sol-gel method. The cell parameters of films were calculated with help of whole-pattern fitting procedure. The evolution of strain, shift of absorption edge and change in the band tailing with film thickness were found and analyzed for amorphous and polycrystalline PUT films. The refractive index n was computed with help of "Envelope method" and dielectric function was calculated by fitting the measured optical transmission spectrum.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 4
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