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Auto-calibrated capacitive MEMS accelerometer

Title
Auto-calibrated capacitive MEMS accelerometer
Type
Article in International Conference Proceedings Book
Year
2008
Authors
L. A. Rocha
(Author)
FEUP
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Lukas Mol
(Author)
FEUP
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Edmond Cretu
(Author)
FEUP
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Reinoud F. Wolffenbuttel
(Author)
FEUP
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José Machado da Silva
(Author)
FEUP
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Conference proceedings International
Pages: 1-4
14th IEEE International Mixed-Signals, Sensors and Systems Test Workshop - IMSTW 2008
Vancouver, Canada, 18 a 20 de Junho de 2008
Scientific classification
FOS: Engineering and technology > Other engineering and technologies
Other information
Abstract (EN): An electronic calibration technique for capacitive MEMS accelerometers based on the measurement of pull-in voltages is described. A combination of pull-in voltages and resonance frequency measurements can be used for the estimation of processinduced variations in device dimensions from layout and deviations in material properties from nominal value, which enables auto-calibration. Measurements on fabricated devices confirm the validity of the proposed technique and electronic calibration is experimentally demonstrated.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 4
License type: Click to view license CC BY-NC
Documents
File name Description Size
IMSTW08 253.23 KB
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Capacitive MEMS accelerometers testing mechanism for auto-calibration and long-term diagnostics (2007)
Article in International Conference Proceedings Book
L. A. Rocha; Lukas Mol; Edmond Cretu; Reinoud F. Wolffenbuttel; José Machado da Silva
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