A Comparison of ADC Test Methods

• Type: Article in International Conference Proceedings Book
• Date: 2000

Authors

Hélio Mendonca (Author) FEUP; José Machado da Silva (Author) FEUP; José Silva Matos (Author) FEUP

Conference proceedings International

Title: Proceedings of DCIS'00 - XV Design of Circuits and Integrated Systems Conference

Pages: 102-107

XV Design of Circuits and Integrated Systems Conference DCIS'00

Montpellier, França, 21 a 24 de Novembro de 2000

Other information

Abstract (EN): In this paper a comparison of the three most common test methods used on dynamic ADC testing is presented. This comparison is centred on three main figures of merit: functional performance characterisation parameters provided by the method, test implementation requirements, as well as computational effort and final precision and accuracy. Results are presented which support the comparison being done and highlight the differences presented by the methods.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6