A low-power oscillation based LNA BIST scheme

• Type: Article in International Conference Proceedings Book
• Date: 2006

Authors

José Machado da Silva (Author) FEUP

Conference proceedings International

Title: IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings

Pages: 268-272

International Conference on Design and Test of Integrated Systems in Nanoscale Technology

Tunis, TUNISIA, SEP 05-07, 2006

Indexing

ISI Web of Knowledge - 5 Citations

Scopus - 5 Citations

INSPEC

Scientific classification

FOS: Engineering and technology > Other engineering and technologies

CORDIS: Technological sciences > Engineering > Electronic engineering

Other information

Authenticus ID: P-004-PWW

DOI: 10.1109/dtis.2006.1708655

Abstract (EN): Test stimuli generation and power consumption are two Issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier Into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynan-dc power supply current and the LNA's output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the Interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5