Accurate subpixel corner detection on planar camera calibration targets

• Type: Article in International Scientific Journal
• Date: 2007

Authors

da Silva Tavares, PJ (Author) Other; Mário Vaz (Author) FEUP

Journal

Title: Optical Engineering

Vol. 46 No. 10

Pages: 1072051-107205

ISSN: 0091-3286

Publisher: SPIE

Indexing

ISI Web of Knowledge - 5 Citations

Scopus - 14 Citations

Scientific classification

CORDIS: Technological sciences > Technology > Optronics

Other information

Authenticus ID: P-004-7AP

DOI: 10.1117/1.2790926

Abstract (EN): Feature detectors have long been one of the touchstones of image processing. Most vision tasks are entirely dependent on the accurate determination of fiducial marks on images, which ultimately led to a quest for methods able to detect feature locations with high resolution. We report the development of an intensity-based subpixel corner detector based on the two-dimensional (2-D) Hilbert transform. Extensive testing of both accuracy and precision with live images finds the method adequate for subpixel detection at better than 10(-1) pixel accuracy. The subpixel corner detectors and the evaluation proposals to date are briefly reviewed, and the proposed method is described. The results are shown and discussed. (c) 2007 Society of Photo-Optical Instrumentation Engineers.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 8