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Cross-correlation between iDD and vOUT signals for testing analogue circuits

Title
Cross-correlation between iDD and vOUT signals for testing analogue circuits
Type
Article in International Scientific Journal
Year
1995
Authors
José Alberto Peixoto Machado da Silva
(Author)
FEUP
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José Alfredo Ribeiro da Silva Matos
(Author)
FEUP
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Ian Bell
(Author)
Other
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Gaynor Taylor
(Author)
Other
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Journal
Title: Electronics LettersImported from Authenticus Search for Journal Publications
Vol. 31 No. 19
Pages: 1617-1618
ISSN: 0013-5194
Publisher: Wiley-Blackwell
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
CORDIS: Technological sciences > Engineering > Electronic engineering
Other information
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 2
Documents
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