Resumo (PT):
Abstract (EN):
This paper proposes an infrastructure and methodology for testing analogue and mixed-signal cores embedded in systems-on-chip. It comprises an application specific processor and wrappers around the cores under test. The processor, which can be implemented on the reconfigurable area of the chip, is responsible for the scheduling and control of test operations, as well as for the interface with the external tester. On-chip stimuli generation, test control, and data compression allow for minimizing external tester interface resources and test time. The testing of an A/D converter is described as an example. This test is performed using an algorithm that allows measuring harmonic distortion after a reduced number of signatures.
Language:
English
Type (Professor's evaluation):
Scientific
No. of pages:
6