A New BIST Scheme for Sigma-Delta Modulators

• Type: Article in International Conference Proceedings Book
• Date: 2001

Authors

José Machado da Silva (Author) FEUP; José Silva Matos (Author) FEUP; Jorge Duarte (Author) Other

Conference proceedings International

Title: Proceedings of the 16th Conference on Design of Circuits and Integrated Systems

Pages: 173-177

XVI Conference on Design of Circuits and Integrated Systems

Porto, 20 a 23 de Novembro de 2001

Other information

Abstract (EN): A method for characterizing modulators is described which can be built in large integrated circuits or systems-on-chip. The method can be used to measure gain and phase, as well as, total harmonic distortion and signal to noise and harmonic distortion ratio parameters. It is prone to be built in circuit, when computational resources such as digital signal processors or re-programmable logic are available, but can also be used in computer simulations making it easier to compare expected with measured performances.

Language: Portuguese

Type (Professor's evaluation): Scientific

No. of pages: 5