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Electronic circuits parametric measurement : a new approach in electrical metrology

Title
Electronic circuits parametric measurement : a new approach in electrical metrology
Type
Article in International Conference Proceedings Book
Year
2003
Authors
Diamantino Rui da Silva Freitas
(Author)
FEUP
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Artur Agostinho dos Santos Capelo Cardoso
(Author)
FEUP
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José Carlos Oliveira de Sousa
(Author)
FEUP
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Conference proceedings International
Pages: 880-883
Metrology in the 3rd Millennium
Dubrovnik, Croácia, 22 a 27 de Junho de 2003
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
CORDIS: Technological sciences > Engineering > Electrical engineering
Other information
Resumo (PT): Apresentado e publicado nas actas do XVII IMEKO World Congress, Metrology in the 3rd Millennium, que se realizou em Junho 22-27, 2003, em Dubrovnik, Croácia
Language: English
Type (Professor's evaluation): Scientific
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