A METHOD FOR THE IN-CIRCUIT TESTING OF SIGMA-DELTA MODULATORS

• Type: Article in International Conference Proceedings Book
• Date: 2001

Authors

Jorge Duarte (Author) Other; José Machado da Silva (Author) FEUP; José Silva Matos (Author) FEUP

Conference proceedings International

Title: Proceedings of the 6th Euro Workshop on ADC Modelling and Testing

Pages: 151-154

6th Euro Workshop on ADC Modelling and Testing

Lisboa, Portugal, 13 a 14 de Setembro de 2001

Other information

Abstract (EN): A method for the in-system functional testing of sigma-delta modulators is described which can be built in complex integrated circuits or systems on chip. It allows for measuring gain and phase, as well as total harmonic distortion and signal to noise and harmonic distortion ratio parameters. This method can be built in-circuit using computational resources such as digital signal processors or re-programmable logic. Particularly interesting is the use of re-configurable logic from which advantage can be taken to implement test operations.

Language: Portuguese

Type (Professor's evaluation): Scientific

No. of pages: 4