A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits

• Type: Article in International Conference Proceedings Book
• Date: 2015

Authors

Goncalves, H (Author) Other; Li, X (Author) Other; Correia, M (Author) Other; Vítor Grade Tavares (Author) FEUP; Carulli, J (Author) Other; Butler, K (Author) Other

Conference proceedings International

Title: Proceedings -Design, Automation and Test in Europe, DATE

Pages: 1042-1047

2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015

9 March 2015 through 13 March 2015

Indexing

ISI Web of Knowledge - 4 Citations

Other information

Authenticus ID: P-00P-C4Q

Abstract (EN): In this paper, we adopt a novel numerical algorithm, referred to as dual augmented Lagrangian method (DALM), for efficient test cost reduction based on spatial variation modeling. The key idea of DALM is to derive the dual formulation of the L-1-regularized least-squares problem posed by Virtual Probe (VP), which can be efficiently solved with substantially lower computational cost than its primal formulation. In addition, a number of unique properties associated with discrete cosine transform (DCT) are exploited to further reduce the computational cost of DALM. Our experimental results of an industrial RF transceiver demonstrate that the proposed DALM solver achieves up to 38 runtime speed-up over the conventional interior-point solver without sacrificing any performance on escape rate and yield loss for test applications.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6