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A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits

Title
A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
Type
Article in International Conference Proceedings Book
Year
2015
Authors
Goncalves, H
(Author)
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Li, X
(Author)
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Correia, M
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Vítor Grade Tavares
(Author)
FEUP
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Carulli, J
(Author)
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Butler, K
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Conference proceedings International
Pages: 1042-1047
2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
9 March 2015 through 13 March 2015
Other information
Authenticus ID: P-00P-C4Q
Abstract (EN): In this paper, we adopt a novel numerical algorithm, referred to as dual augmented Lagrangian method (DALM), for efficient test cost reduction based on spatial variation modeling. The key idea of DALM is to derive the dual formulation of the L-1-regularized least-squares problem posed by Virtual Probe (VP), which can be efficiently solved with substantially lower computational cost than its primal formulation. In addition, a number of unique properties associated with discrete cosine transform (DCT) are exploited to further reduce the computational cost of DALM. Our experimental results of an industrial RF transceiver demonstrate that the proposed DALM solver achieves up to 38 runtime speed-up over the conventional interior-point solver without sacrificing any performance on escape rate and yield loss for test applications.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 6
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