Abstract (EN):
This paper adopts the fractional calculus to model a pn semiconductor diode under sinusoidal operation. The electrical impedance spectroscopy and the describing function techniques are used for measuring the device impedance. The experimental data is approximated by means of fractional-order models. The results demonstrate that the proposed approach describes the diode impedance using a limited number of parameters, while highlighting relevant dynamic characteristics that are overlooked by classical models. (C) 2018 Published by Elsevier B.V.
Language:
English
Type (Professor's evaluation):
Scientific
No. of pages:
11