Analysis of Materials Emissivity Based on Image Software

• Type: Article in International Conference Proceedings Book
• Date: 2016

Authors

Pitarma, R (Author) Other; Crisostomo, J (Author) Other; Jorge, L (Author) Other

Conference proceedings International

Title: NEW ADVANCES IN INFORMATION SYSTEMS AND TECHNOLOGIES, VOL 1

Pages: 749-757

World Conference on Information Systems and Technologies (WorldCIST)

Recife, BRAZIL, MAR 22-24, 2016

Indexing

ISI Web of Knowledge - 3 Citations

Scopus - 0 Citations

Other information

Authenticus ID: P-00K-AJX

DOI: 10.1007/978-3-319-31232-3_70

Abstract (EN): Thermography Infrared (TIV) is a nondestructive diagnostic technique, with non-contact, to evaluate the surface temperature of objects based on the emitted radiation. The surface temperature field is carried out using an image that reproduces color patterns. As a non-destructive, versatile, and non-contact technique, constitutes a very useful tool in various fields. Active or passive heating procedures may be used. Nevertheless, accurate measurement of temperature is strongly dependent on the emissivity value of the material. This study presents and discusses a methodology for measuring the materials emissivity using image processing software. The results show an effective and valuable contribution in this field, especially for application in active thermography.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 9