Persistence of the orthorhombic phase in YMnO3 hexagonal thin films

• Type: Article in International Scientific Journal
• Date: 2016

Authors

Romaguera Barcelay, Y (Author) Other; Agostinho Moreira, JA (Author) FCUP; Almeida, A (Author) FCUP; Tavares, PB (Author) Other; Fernandes, L (Author) Other; Perez de la Cruz, JP (Author) Other

Journal

Title: Ferroelectrics

Vol. 498

Pages: 80-84

ISSN: 0015-0193

Publisher: Taylor & Francis

Indexing

ISI Web of Knowledge - 0 Citations

Scopus - 1 Citation

Other information

Authenticus ID: P-00K-JJZ

DOI: 10.1080/00150193.2016.1168211

Abstract (EN): YMnO3 thin films were prepared based on a chemical solution deposition route. Their structure was studied as a function of the annealing temperature using X-ray diffraction, Raman spectroscopy, and electron backscatter diffraction. For annealing temperatures above 850 degrees C the films, though crystallizing predominantly in a P6(3)cm hexagonal structure, exhibit a thin Pnma orthorhombic phase close to the film-substrate interface. It is shown that the residual orthorhombic structure is associated with a substrate induced strain state, characterized by an expansion in the in-plane a direction, and a compression in the out of plain c direction.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5