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A methodology development for the study of near surface stress gradients

Title
A methodology development for the study of near surface stress gradients
Type
Article in International Scientific Journal
Year
2000
Authors
M. J. Marques
(Author)
Other
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Dias, AM
(Author)
Other
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Gergaud, P
(Author)
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Lebrun, JL
(Author)
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Journal
The Journal is awaiting validation by the Administrative Services.
Vol. 287
Pages: 78-86
ISSN: 0921-5093
Other information
Authenticus ID: P-000-ZFR
Abstract (EN): A modification of the geometry used in the sin(2) psi technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted F-ij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 9
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