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A procedure to obtain the probabilistic kitagawa-takahashi diagram

Title
A procedure to obtain the probabilistic kitagawa-takahashi diagram
Type
Article in International Scientific Journal
Year
2016
Authors
Abilio M P De Jesus
(Author)
FEUP
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A. Fernandez-Canteli
(Author)
Other
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R. Brighenti
(Author)
Other
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Moreira, PMGP
(Author)
FEUP
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Journal
Vol. 78 No. 1
Pages: 3-12
ISSN: 1454-2358
Indexing
Other information
Authenticus ID: P-00M-E15
Abstract (EN): An alternative way of interpreting the Kitagawa-Takahashi diagram for structural components is proposed. With this aim, the equivalent initial flaw size (EIFS) model, as a way of defining the initial defects of the structural components is used in conjunction with the probabilistic S-N model proposed by Castillo and Canteli, thus allowing the probabilistic distribution of the EIFS to be generated and, consequently, a probabilistic definition of the KT diagram (P-KT) to be achieved. The proposed approach is applied to a notched plate made of P355NL1 steel, the results of predictions are analyzed and the deviations discussed.
Language: English
Type (Professor's evaluation): Scientific
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