Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports

• Type: Poster in an International Conference
• Date: 2012-06

Authors

José Martins Ferreira (Author) FEUP; Francisco R. Fernandes (Author) Other; Ricardo J. S. Machado (Author) Other; Manuel G. Gericota (Author) Other

Conference International

18th IEEE International On-Line Testing Symposium

Sitges, Spain, 27-29 June 2012

Indexing

ISI Web of Science

Scopus

INSPEC

Scientific classification

CORDIS: Technological sciences > Engineering > Electrical engineering

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

DOI: 10.1109/IOLTS.2012.6313858

Abstract (EN): In this paper, we present a description of our developed adapter, which takes acts as a gateway between IEEE 1149.1 and IEEE 1149.7 test infrastructures. The referred adapter reduces the pins of the TAP from 4 to 2 and implements advanced capabilities, such as Parking State of a TAPC and the Reset and Selection Unit (RSU).

Language: English

Type (Professor's evaluation): Scientific