Abstract (EN):
The new generations of SRAM-based FPGA
devices, built on nanometer technology, are the
preferred choice for the implementation of
reconfigurable computing platforms. However,
smaller technological scales increase their
vulnerability to manufacturing imperfections and
hence to the occurrence of electromigration.
Moreover, the large internal RAM (for configuration
purposes or as embedded memory blocks) makes
them more prone to soft errors.
The incorporation of self-reconfiguration
capabilities in recent FPGAs, allied to the use of soft
and hard microprocessor cores, facilitates the offset
of these vulnerabilities by enabling the development
of self-restoring fault tolerant reconfigurable
systems. In the methodology presented in this paper,
the embedded microprocessor is also responsible for
the implementation of online self-test-and-repair
strategies, based on modular redundancy and on
self-reconfiguration. The detection of faults, caused
by soft or hard errors, may be followed by repairing
actions, depending on the fault type. This approach
leads to smoother system degradation, extending its
lifetime and improving its reliability.
Language:
English
Type (Professor's evaluation):
Scientific
No. of pages:
4
License type: