Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

• Type: Article in International Conference Proceedings Book
• Date: 1996

Authors

José Machado da Silva (Author) FEUP; José Silva Matos (Author) FEUP

Conference proceedings International

Title: EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS

Pages: 264-269

European Design and Test Conference

PARIS, FRANCE, MAR 11-14, 1996

Indexing

Scopus - 0 Citations

Other information

Authenticus ID: P-00J-XMX

DOI: 10.1109/EDTC.1996.494159

Abstract (EN): The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. © 1996 IEEE.

Language: English

Type (Professor's evaluation): Scientific