A method for the in-circuit testing of ¿¿ modulators

• Type: Article in International Conference Proceedings Book
• Date: 2001

Authors

José Machado da Silva (Author) FEUP; Duarte, JS (Author) Other; Matos, JS (Author) Other

Conference proceedings International

Title: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001

Pages: 634-637

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001

13 September 2001 through 14 September 2001

Indexing

Scopus - 0 Citations

Other information

Authenticus ID: P-00G-Q0S

Abstract (EN): A method for characterizing modulators is described which can be built in large integrated circuits or systems-on-chip. The method can be used to measure gain and phase, as well as, total harmonic distortion and signal to noise and harmonic distortion ratio parameters. It is prone to be built in circuit, when computational resources such as digital signal processors or re-programmable logic are available, but can also be used in computer simulations making it easier to compare expected with measured performances.

Language: English

Type (Professor's evaluation): Scientific