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CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOG CIRCUITS

Title
CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOG CIRCUITS
Type
Article in International Scientific Journal
Year
1995
Authors
José Machado da Silva
(Author)
FEUP
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MATOS, JS
(Author)
Other
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BELL, IM
(Author)
Other
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TAYLOR, GE
(Author)
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Journal
Title: Electronics LettersImported from Authenticus Search for Journal Publications
Vol. 31 No. 19
Pages: 1617-1618
ISSN: 0013-5194
Publisher: Wiley-Blackwell
Other information
Authenticus ID: P-001-GBA
Abstract (EN): The cross-correlation between i(DD) and v(out) signals is addressed as a means for improving the testing of analogue circuits. Besides the higher testing confidence provided by mixed i(DD)/v(out) monitoring, a single unified test operation is performed instead of two separate operations.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 2
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