Using power supply current monitoring and P1149.4 for parametric testing of passive components

• Type: Article in International Conference Proceedings Book
• Date: 1997

Authors

José Machado da Silva (Author) FEUP; Matos, JS (Author) Other

Conference proceedings International

Title: ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE

Pages: 2713-2716

1997 IEEE International Symposium on Circuits and Systems (ISCAS 97) - Circuits and Systems in the Information Age

HONG KONG, HONG KONG, JUN 09-12, 1997

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Scopus - 1 Citation

Other information

Authenticus ID: P-001-CK8

Abstract (EN): The detection and location of faulty passive components is crucial in testing printed circuit boards. This issue is one of the objectives to be satisfied by the development of a mixed-signal test bus standard - IEEE P1149.4 - now on the final phase of evaluation. In this paper a method is presented that enables electronic in-circuit testing for presence and value of passive components, based on the use of analogue boundary modules like those developed under P1149.4, but making use of the positive power supply rail as an analogue test line. This method allows saving one analogue test line while profiting from the eventual presence of current sensors inserted for power supply current monitoring.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 4