ADC testing using joint time-frequency analysis

• Type: Article in International Conference Proceedings Book
• Date: 1999

Authors

Helio Mendonca (Author) FEUP; José Machado da Silva (Author) FEUP; José Silva Matos (Author) FEUP

Conference proceedings International

Title: THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS

Pages: 157-159

3rd International Conference on Advanced A/D and D/A Conversion Techniques and their Applications

GLASGOW, SCOTLAND, JUL 27-28, 1999

Indexing

ISI Web of Knowledge - 2 Citations

Scopus - 1 Citation

Other information

Authenticus ID: P-007-8RT

DOI: 10.1049/cp:19990486

Abstract (EN): An account is given on the joint time-frequency analysis (JTFA) and the short time-frequency transform algorithm in particular as an alternative technique for dynamic testing of analog to digital converters (ADCs). It is shown that this technique can lead to a significant improvement in ADC testing mainly due the possibility of using non-stationary signals allowing a more rapid test capable of analyzing even localized features.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 3