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An I2C Based Mixed-Signal Test and Measurement Infrastructure

Title
An I2C Based Mixed-Signal Test and Measurement Infrastructure
Type
Article in International Conference Proceedings Book
Year
2014
Authors
Salazar Escobar, AJS
(Author)
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José Machado da Silva
(Author)
FEUP
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Correia, M. V.
(Author)
FEUP
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Conference proceedings International
19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW)
Porto Alegre, BRAZIL, SEP 17-18, 2014
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Authenticus ID: P-00G-1KZ
Abstract (EN): The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 6
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